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5th CCM international conference on pressure metrology

• primary standards for low, medium and high pressures
• primary standards and traceability for partial pressures and leak rates
• physical and material properties and phenomena relevant to vacuum and pressure metrology
• secondary and transfer standards and innovative and advanced sensors and gauges for pressure and vacuum metrology
• secondary and transfer standards for low gas flows (leak rates)
• new approaches on accurate total and partial pressure measurement
• comparisons of vacuum and pressure standards and very low gas flows (leak rates) at the international level (registered by the BIPM)
• traceability, dissemination, calibration and accreditation for vacuum and pressure measurements
• challenging applications for most accurate pressure and vacuum measurements

4th International Conference IMEKO TC16

• national secondary standards for low, medium and high pressures
• provision of measurement standards in newly developing economies
• comparisons of vacuum and pressure standards and very low gas flows (leak rates) at the national or international level (not registered by the BIPM)
• pressure and vacuum sensors for industry
• partial pressure measurement
• standardization on pressure and vacuum technology
• challenges of pressure and vacuum measurement for research and industrial applications